Stress maps of 304 austenitic stainless steel sheets at tensile stresses were measured and analysed by u- sing polycrystalline X-ray two-dimensional area detectors diffraction system.
利用多晶X射线面探测器衍射系统对304奥氏体不锈钢板在拉伸状态下的应力及其分布进行了检测分析。
The textures of deep drawing aluminium sheets were measured with X-ray area detector diffraction system and the relationship between the two-dimensional diffraction data and ODF was investigated.
以材料织构在线检测技术为应用背景,用X射线多晶面探测器测量了深冲压铝板的织构,研究了X射线二维衍射数据与晶体取向分布函数之间的关系,分析了用面探测器采集极图上不同区域数据对计算取向分布函数的影响。
The achievement of high brilliant X-ray source, the principle and application of 2-dimensional electronic area detector, image plate (IP) and charge coupled device ( CCD), were described.
介绍高亮度X射线光源的获得,能够大幅度提高衍射数据收集速度和灵敏度的二维电子面探测器成像板IP和电荷耦合器件CCD的工作原理和应用等,并通过实例说明这些技术上的重大进步正在极大地推动人们对物质微观结构的深入认识并带来巨大的成果。
Geometry efficiency of disc detector to parallel disc source in the situation,whichC≠0(the distance from axis of detector and axis of source is called as C) is calculated by basic Monte Carlo method,and then compared with that of disc detector to disc source in the case that C=0.
用基本Monte Carlo方法计算了圆面探测器对均匀平行圆面源(两圆面中心轴线间距离为C)的几何因子,并且与圆面探测器对均匀同轴圆面源的几何因子进行了比较,探讨了两圆面中心轴线间距离C对几何因子的影响;为了检验本文方法及所编程序的好坏,选取c=0时的数据与多边形近似法进行了比较。
Geometry efficiency of disc detector to disc source in the situation,which α≠0(the angle from axis of detector and axis of source is called as α),is calculated by basic Monte Carlo method,and then compared with that of disc detector to disc source in the case that α=0.
用基本Monte Carlo方法计算了圆面探测器对均匀非严格平行圆面源(两圆面中心轴线相交成α度)的几何因子,并且与圆面探测器对均匀同轴圆面源的几何因子进行了比较,探讨了两圆面中心轴线间夹角α对几何因子的影响;为了检验本文方法及所编程序的好坏,选取α=0时的数据与多边形近似法进行了比较。
Geometry efficiency of disc detector to parallel disc source in the situation,whichC≠0(the distance from axis of detector and axis of source is called as C)is calculated by ellipse observation factor weight Monte Carlo method,and then com- pared with that of disc detector to disc source in the case that C=0.
用椭圆观察因子加权Monte Carlo方法计算了圆面探测器对均匀平行圆面源(两圆面中心轴线间距离为C)的几何因子,并且与圆面探测器对均匀同轴圆面源的几何因子进行了比较,探讨了两圆面中心轴线间距离C对几何因子的影响;为了检验本文方法及所编程序的好坏,选取c=0时的数据与多边形近似法进行了比较。
Study of Backside Passivation in InSb Focal Plane Detector
InSb焦平面探测器背面钝化的研究
It is composed of2 D profile detector, depth-dose detector and rang tuning detector.
该系统主要由2D剖面探测器、照深度和剂量探测器、程调整器等组成。
Marine oil-water interface detector specificatio
GB/T12921-1991船用油水界面探测器技术条件
Effect of AlN passivation on mesa structured PIN InGaAs detector
InGaAs台面探测器的AlN钝化研究
The Developing Situation About HgCdTe IRFPA in Russia
俄罗斯HgCdTe红外焦平面探测器的现状
Development in Shortwave Infrared Focal Plane Array and Application
短波红外焦平面探测器及其应用进展
gold silicon junction semiconductor detector
金－硅面垒型半导体探测器
Partially depleted gold silicon surface barrier detectors
GB/T13178-1991金硅面垒型探测器
CdSe Detector Wafer Surface Treatment and Passivation Study;
CdSe探测器晶片表面处理和钝化研究
Research on Infrared Focal Plane Array Detector Key Technology;
红外焦平面阵列探测器关键技术研究
Current-voltage characteristics of planar-type InGaAs infrared detectors
平面型InGaAs红外探测器I-V特性研究
Temperature-dependent characteristics study of 2.6μm planar-type InGaAs infrared detector
平面型2.6μm InGaAs红外探测器变温特性研究
Research on CdZnTe Planar Detector
CdZnTe平面核辐射探测器研究
320×256 InGaAs Short Wave Infrared Focal Plane Arrays Detector
320×256 InGaAs短波红外焦平面阵列探测器
Development of Low Energy X-ray Si-PIN Detectors Based on Planar technology
平面工艺Si-PIN低能X射线探测器研制
The Muon Counter is one of the important detectors in BES.
μ子探测器是安装在北京谱仪上面的重要的探测器之一。
Development of Large Area Si Detectors Based on Planar Technology for Charged Particles
大面积平面工艺Si带电粒子探测器研制
The spacecraft were not able to measure the temperature on the surface of Jupiter.
探测器没有对木星表面的温度进行测量。