Analyzes in detail the principle of thickness measurement of metallic waveguide iris by means of the electromagnetic field theory.
运用电磁场理论对金属波导膜厚测量的原理进行了详细分析,并且研制了一台膜厚测量仪,理论和实践表明:可以通过测量复合金属波导膜系励磁电流的脉冲波形来控制薄膜的生长厚度。
Thickness Measurement of In_xGa_(1-x)N Semiconductor Film Based on Reflection Spectra
基于反射光谱的In_xGa_(1-x)N半导体薄膜厚度测量
Measuring thin-film thickness with phase-shift interferometry
基于相位偏移干涉术的薄膜厚度测量方法
Determination of thickness of plastic film and sheeting by mechanical scanning
GB/T6672-1986塑料薄膜和薄片厚度的测定机械测量法
Design of ARM920T-based Online Measuring System for Thickness of Thin Films
基于ARM920T的薄膜厚度在线测量系统设计
Investigation into Measuring Nanometer Lubrication Film Thickness by Relative Light Intensity Principle
相对光强原理测量纳米级润滑薄膜厚度的研究
Research of Online Noncontact Film-Thickness Measuring System Based on DSP;
基于DSP的非接触薄膜厚度在线测量系统研究
Refractive Index and Thickness of Michelson Interferometer Measure Film;
迈克尔逊干涉仪测量薄膜的折射率与厚度
Thickness Measurement of Thin Film Based on White-Light Spectral Interferometry
基于白光干涉的光学薄膜物理厚度测量方法
The Measurement Based on CCD Method about Thickness of Liquid Films and the Analysis of Break-down Characteristic of Thin Films;
基于CCD方法的液膜厚度测量及薄膜破断特性的分析
Film Thickness of the Alpha Energy Loss Measurement and Detection Efficiency γ Spectrum of MCNP Simulation Method Described;
薄膜厚度的α能损法测量和γ谱探测效率的MCNP模拟描述方法研究
Research Development of Measurement Methods for Piezoelectric Coefficient of Thin/Thick Film
薄/厚膜压电参数测量方法的研究进展
testing method for thickness of plastic film and sheeting
塑料薄膜和片材的厚度测定法
THE THICKNESS AND REFACTURE INDEX OF SINGLELAYER FILM MEASURED BY MICHELSON INTERFEROMETER
用迈克尔逊干涉仪测量单层薄膜的厚度和折射率
Thickness Measurement of Thin Film on Polycrystalline Preferred Orientation Material by X-Ray Diffraction
具有择优取向性的基材表面的薄膜厚度的X射线衍射测量修正
DETERMINATION OF INTERFACE PROPERTIES BETWEEN MICRON-THICK METAL FILM AND CERAMIC SUBSTRATE
微米厚度金属薄膜/陶瓷基体界面力学性能的实验测量与数值模拟
Study on Determination of Optical Constants and Thickness of Thin Films by Transmission Spectrum Method;
薄膜光学常数和厚度的透射光谱法测定研究
Research on Scanning System for Measuring the Thickness of Plastic Film Based on Capacitive Sensor;
电容式塑料薄膜厚度扫描检测系统的研究
Determination of the optical constants and thicknesses of MEH-PPV and PFO thin films
MEH-PPV和PFO发光薄膜的光学常数和厚度测定