Two kinds of layout designs and the method of lowering the impurity concentration of the gate region are proposed to improve the current rating of GATs.
对 GAT (Gate Associated Transistor)型高速高压功率开关管提出了一些新的结构改进设想 ,包括两种新的平面版图设计以及改变栅区掺杂浓度 ,以解决其最大集电极电流远小于常规双极功率管这个关键问题 ,并对此进行了计算机仿真及试验研究 。
Considering that the current rating of GAT (Gate Associated Transistor) power transistor is much smaller than that of conventional bipolar transistors,some new ideas of structure improvement are proposed in this paper.
针对目前 GAT(Gate Associated Transistor)型高速高压功率开关管中存在的最大集电极电流远小于常规双极功率管这个关键问题提出一些新的结构改进设想 ,包括改变栅区掺杂浓度以及平面版图设计 ,并对此进行了仿真研究 。